Design experiments to identify and segment the limiting reliability mechanisms impacting NAND quality. Design high volume electrical experiments (both wafer level and component level) and perform statistical data analysis to validate process/trims solutions required to close reliability gaps. Contribute to develop forward looking technology path finding for next NAND generation, including reliability risk assessment and product capability projections, identify innovative design and product features required to meet quality specification. Proven experience with NAND device structures, operations and algorithms Knowledge and understanding of electrical properties of semiconductor and insulator materials, semiconductor device physics and solid-state physics In-depth understanding of physics-based modeling of non-volatile memory and semiconductor devices failure mechanisms, reliability analysis Knowledge and understanding of statistical analysis and numerical computing software (Matlab, Octave, JMP) Knowledge and ability of scripting languages (C, C++, Matlab, Perl) Familiar with Big Data and database queries Knowledge of JEDEC standards
